Super high throughput smart handler will significantly improve throughput and running cost compared to conventional type handler, up to 304 devices is tested and programmed simultaneously 

FEATURES

•  High throughput
  •  Capable of transferring, testing and burn-programming up to 30,000 UPH*1
  •  Capable up to 304*1 devices simultaneously testing and burn-programming
•  Ideal for testing and burn-programming flash memory embedded IC
  •  SPI, NAND, NOR flash memory
  •  Flash memory embedded MCU
•  High reliable socketless contacting mechanism
  •  No Lead damage using original test tray

*1 Depend on number of ICs on the JEDEC tray